Package: Reliability of RF MEMS
| ref137 | Performance and reliability of post-CMOS metal/oxide MEMS for RF application | Publication |
| ref164 | Joule heat effects on reliability of RF MEMS switches | Thesis |
| ref174 | Microelectromechanical Systems (MEMS) based advanced high performance Radio Frequency (RF) systems | Presentation |
| ref204 | Reliability Study of Low-Voltage RF MEMS Switches | Publication |
| ref212 | A Mechanical Approach to Overcome RF MEMS Switch Stiction Problem | Publication |
| ref248 | Techniques to study the reliability of metal RF MEMS capacitive switches. | Publication |
| ref254 | A low frequency electrical test set-up for the reliability assessment of capacitive RF MEMS switches | Publication |
| ref271 | Reliability of RF-MEMS | Presentation |
| ref273 | Reliability testing of flexible printed circuit-based RF MEMS capacitive switches | Publication |
| ref320 | Techniques for reliability analysis of MEMS RF switch | Publication |
| ref327 | Steady state thermal analysis and high-power reliability considerations of RF MEMS capacitive switches | Publication |
| ref328 | Atomic Layer Deposition (ALD) Technology for Reliable RF MEMS | Publication |
| ref336 | Experimental characterization of stiction due to charging in RF MEMS | Publication |
| ref345 | A novel device for in situ experimental characterization and reliability analysis of DC-contact RF MEMS switches | Publication |
| ref346 | RF MEMS Reliability | Publication |
| ref349 | Low-Actuation Voltage RF MEMS Shunt Switch With Cold Switching Lifetime of Seven Billion Cycles | Publication |
| ref350 | MEMS for telecommunications : devices and reliability | Publication |
| ref351 | Reliability behavior of RF MEMS | Publication |
| ref353 | Reliability overview of RF MEMS devices and circuits | Publication |
| ref354 | MEMS 2-Bit Phase-Shifter Failure Mode and Reliability Considerations for Large X-Band Arrays | Publication |
| ref365 | Alleviating the Adverse Effects of Residual Stress in RF MEMS Switches | Publication |
| ref373 | A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches | Publication |
| ref389 | High Power (>1W) Application RF MEMS Lifetime Performance Evaluation | Publication |
| ref392 | Effect of temperature on capacitive RF MEMS switch performance : a couple field analysis | Publication |
| ref395 | Environmental test bench for reliability studies: Influence of the temperature on RF switches with metallic membranes | Publication |
| ref397 | Reliability of Capacitive RF MEMS Switches at High and Low temperatures | Publication |
| ref399 | Identification of Residual Stress State in a RF MEMS device | Publication |
| ref401 | Reliability of RF-MEMS : challenges and method | Presentation |
| ref411 | Investigation of dielectric degradation of microwave capacitive microswitches | Publication |
| ref412 | Initial observation and Analysis of Dielectric Charging effects on RF MEMS capacitive switches | Publication |
| ref413 | Asperity Heating for Repair of Metal Contact RF MEMS switches | Publication |
| ref428 | Numerical Modeling of imperfect contacts in capacitively coupled RF MEMS switches | Publication |
| ref430 | An experimental/computational Approach to Identify Moduli and Residual Stress in MEMS Radio-Frequency Switches | Publication |
| ref431 | Mechanics-based solutions to RF MEMS switch stiction Problem | Publication |
| ref434 | Simulation for failure analysis of "Series and Parallel" switched power circuit breaker | Presentation |
| ref50 | Radiation Effects in MicroElectroMechanical Systems (MEMS): RF Relays | Publication |
| x24 | Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS) | Publication |
| x5 | Reliability approach in the design of RF microswitches | Publication |
| ref446 | Lifetime characterization of capacitive RF MEMS switches | Publication |
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