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Special offer for RF MEMS :

Delfmems proposes to win

a total electrical/mechanical reliability analysis

 

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WINNERS :

 

NMRC (Cork, Ireland)  : A Low Voltage, Capacitive RF Microswitch

 

United States Naval Academy / Johns Hopkins University Applied Physics Laboratory (Maryland, USA) : Proposed Device for RF MEMS Reliability Analysis

 

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Deadline :   July, 16, 2004

 

Ask for a reference number, send your NDA

(Please indicate Email, Contact, Company, Adress)

Download the brochure

 

 

RF MEMS reliability testing : 2 total analysis to win !

Submit and Profit from our free offers for RF MEMS reliability services.

 
RF MEMS designs depend on the evaluation of the system lifetime and qualification criteria. One final goal is to get a modeling, indicating the evolution of the dynamic system behavior and the probability that a failure mechanism occurs when subjected to actuation ; environment and cyclic stresses inducing mechanical and electrical degradations.

 

Delfmems has a know-how concerning the MEMS reliability since half a decade.

 

Two free electrical/mechanical reliability testing and analysis are now proposed by Delfmems to show the benefit of reliability testing and its know-how.

 

RF MEMS testing is a key element in the development and stabilisation of new manufacturing processes. Submit to Delfmems your RF MEMS for a free reliability analysis. Delfmems is a leading provider in MEMS optimization/reliability services. Delfmems has you an unique set of electrical and mechanical reliability test to qualify your RF MEMS devices, to determine failure mechanisms and to propose you solutions. Sij parameters as well as mechanical parameters (resonance, etc.) can be determined at the same time, in different environment (temperature, pressure) and as a function of operating time.

 
Here is proposed a wonderful opportunity to get free testing of your RF MEMS devices.

 

 

 

Submit your abstract and win a total RF MEMS Reliability analysis.

 

Deadline :   July, 16, 2004

Acceptance : August, 27, 2004

Analysis : September-November

 

Submitted abstract  :
-Your definition of a reliable RF MEMS / qualification criteria,
-The RF device to test, packaged/not packaged
-General properties/datasheet of your device / wafers
-Specific tests you are interested in.
2 pages with pictures; 1 abstract / device.
 
Send abstract to:
DELFMEMS
IEMN, Avenue Poincare, Cite Scientifique
F-59652 France.

Email : [email protected]  (.doc or .pdf version)

 

 
Contract and terms are discussed after acceptance.

Contact: i[email protected]      

 

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